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Dr. Ing. Christine Wünsche

Centre for Applied Research

Institute for Precision Manufacturing and High-Frequency Technology (IPH)

Professor

T 105

09923/80108-405

Sortierung:
Beitrag in Sammelwerk/Tagungsband

  • Jessica Stelzl
  • Christine Wünsche
  • S. Höfer

Influencing factors for a continuous wave UV-laser component

pg. 114780C.

Bellingham, WA, USA

  • (2020)

DOI: 10.1117/12.2564916

During the development of an optical system, one comes to the point where you have to build the optically active element into a mechanical device that becomes part of the system. At this point you come across the well-known question that it is not only necessary to consider and ensure the quality of the individual element. It is also important to look at the entire component in order to identify potential influencing factors on the performance of the optical system. At the beginning of a two-year project at Technologiecampus Teisnach the polishing process of a nonlinear crystal as the crucial component of the optical system was being explored. This system is designed to create continuous wave laser beams in the deep UV range. The crystal has to be embedded between two prisms. Roughness and shape of the crystal is ensured via the polishing process which alone has many influencing factors and was examined at the beginning of the project. The quality of the crystal can be as good as it can be, but if the contacting prisms do not fit, the whole prism-coupled device will become unusable in the overall optical laser system. The performance of the laser can only be achieved by harmonizing all elements of the PCD and the PCD itself into the laser set-up. In the current phase of the project this question will be dealt with. The prism-coupled device is split up into its individual parts, which are the nonlinear crystal, the prisms as optical auxiliary components, micro screws and mechanical support. Going through the requirements to the properties of the crystal and their limitations, the influence of the PCD on the optical performance of the crystal is presented. Here, the main focus is placed on the mode of fixing the crystal between the prisms and on putting the stack of crystal and prisms in the laser beam. The influencing factors between the crystal, the prisms and the method of fixing the PCD are described.
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
  • NACHHALTIG
Beitrag in Sammelwerk/Tagungsband

  • Jessica Stelzl
  • Christine Wünsche
  • S. Höfer

Processing of a new nonlinear optical crystal for continuous wave UV-laser applications

pg. 111710H1-111710H4.

Bellingham, WA, USA

  • (2019)

DOI: 10.1117/12.2528140

Lasers have been known for a long time and are used in a wide variety of fields such as industrial and material processing or measuring and control technology. A new application is being tested which aims to use continuous wave UV-lasers in metrology. For this application a nonlinear optical crystal is needed. Its processing is developed in a two-year project at the Institute for Precision Manufacturing and High-Frequency Technology of Deggendorf Institute of Technology. The crucial factor for the full optical performance in the UV range is the low roughness of the crystal surface, as it is installed between two prisms and the contactability between them should be ensured. In China, a nonlinear crystal that meets the requirements has already been designed and a production process for the raw crystal has been established. However, since the production of optically homogenous crystals has proven to be difficult, the availability of such is very limited. For this reason, a reference material with similar hardness and material behaviour is used in the process development in order not to be limited in the number of trials. It is important to be able to transfer the results from the reference material in an analogous way to the original crystal. One challenge of the project lies in the crystal thickness, since only a maximum thickness of three millimetres can be achieved for the purest form of the crystal required in the application. Therefore, it is important to handle the material sparingly during the process. In addition, the small dimensions of about ten to five millimetres and the brittleness of the material pose a problem. The goal of the project will be to develop a process that can circumvent all these problems so that small roughness of the crystal can be achieved by precision polishing.
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
  • NACHHALTIG
Beitrag in Sammelwerk/Tagungsband

  • Emilio Zambrano
  • Christine Wünsche
  • S. Mechold
  • S. Herr

Cleaning effects in optical layers: error characteristics and analysis methods

pg. 111710F1-111710F9.

Bellingham, WA, USA

  • (2019)

DOI: 10.1117/12.2527974

In the course of the ever-increasing demand of high-performance optical components, dielectric coating processes are the key technology for the refinement of optics, ensuring their functionality. These optics are based on optical interference coatings, which are formed by a layer stack of alternating transparent single layers of high and low refractive index material. Assuming that turbidity as well as defects embedded in coatings are considered as a primary factor limiting the quality of optical coatings, the level of cleaning the substrates before coating has to be extremely high. Particular importance is attached to the interface between the layer stack and the substrate, especially to the interaction during the transition from the glass surface to the coating during the manufacturing process. This interaction is assumed to be caused by polishing, by corrosion during storage time or by effects during cleaning of the substrate before coating. Thus, it is necessary to characterize each type of defect and to define which technique is adequate to analyze each one of them efficiently. The project aims to raise the awareness and knowledge in terms of what happens during the coating process and, in particular, to understand the physical processes at the substrate during the manufacturing process. After analyzing the material flow, first focus was set on the cleaning procedure. It is assumed that one of the main influences on defects in the interface is the chemical cleaning. Chemical reactions on the surface of the glass substrate may occur due to additional effects of external components and elevated temperature in the washing basins.
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • NACHHALTIG
Beitrag in Sammelwerk/Tagungsband

  • Manon Schilke
  • Johannes Liebl
  • Christine Wünsche

Surface reconstruction by using Zernike polynomials

  • (2016)

DOI: 10.1117/12.2236305

The development of high precision methods for the measurement of plano surfaces became of increasing importance over the last years. Recently accuracies in sub-nanometer range have been achieved on samples up to one meter in diameter. The used measurement method was based on direct deflectometry. The main part of the system was an electronic autocollimator measuring local angular displacements on defined traces along the surface of the plano lens. To stabilize the optical path a pentaprism was used. The measurement accuracy of a similar system was evaluated at the Technologie Campus Teisnach. The used system delivered twenty measurement spots along the profile on one diameter. Four diameters were measured at every 45 degrees. An evaluation algorithm was developed to model the complete threedimensional surface out of a small amount of measurement points. Within this modelling Zernike polynomials were used to reconstruct the surface topography. Two different approaches in using the hierarchy of the polynomials were compared. At first a reference surface was created by rotating a symmetrical averaged curve of all measured profiles. On the residuals of the original measurements to the symmetrical averaged curve a serial development of the error surface was applied with the help of Zernike polynomials. Different order of Zernike terms were tested because we saw a big influence on the result. This surface was added to the reference surface. The results of the two different approaches were compared. To enable us to compare the results of this measurement method to interferometric and optical 3Dprofilometric measurements the data was converted to xyz-format. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
  • NACHHALTIG
Vortrag

  • Rolf Rascher
  • Christine Wünsche
  • Christian Schopf

Aspects in laser polishing of precision optical components

In: LaP 2016 - 2nd Conference on Laser Polishing

Aachen

  • 26.-27.04.2016 (2016)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Beitrag in Sammelwerk/Tagungsband

  • Patrick Schäfer
  • Christine Wünsche
  • Rolf Rascher

Quantification of synthetic lens surface characteristics by an optical measurement system as stylus instrument

pg. 944219.

  • (2015)
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
  • NACHHALTIG
Vortrag

  • Patrick Schäfer
  • Christine Wünsche
  • Rolf Rascher

Quantification of synthetic lens surface characteristics by an optical measurement system as stylus instrument

In: Optics and Measurement International Conference 2014

Liberec, Tschechische Republik

  • 07.-10.10.2014 (2014)
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
Vortrag

  • S. Draxinger
  • Christian J. Trum
  • Heiko Biskup
  • Christine Wünsche
  • Rolf Rascher

Active Fluid Jet Polishing - Behaviour on Different Materials

In: Optical Fabrication and Testing (OF&T)

The Optical Society of America (OSA) Kohala Coast, HI, USA

  • 22.-26.06.2014 (2014)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Christine Wünsche

Challenges in Production Technologies in producing surfaces in a quality of Lambda/50

In: 1st European Seminar on Precision Optics Manufacturing

Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach

  • 01.-02.04.2014 (2014)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Zeitschriftenartikel

  • Johannes Liebl
  • Heiko Biskup
  • S. Draxinger
  • Rolf Rascher
  • Christine Wünsche

Process developement fort the reproducible roughness measurement of optical surfaces using white light interferometry

In: International Journal of Metrology and Quality Engineering (EDP Sciences) vol. 5 pg. 29-35.

  • (2014)

  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
Vortrag

  • Christine Wünsche

Automatisierte Sauberkeitskontrolle

In: Spectaris Seminar "Moderne Messtechniken bei Fertigung von Präzisionsoptiken"

Wetzlar

  • 19.02.2014 (2014)
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
Beitrag in Sammelwerk/Tagungsband

  • O. Fähnle
  • E. Langenbach
  • F. Frost
  • A. Schindler
  • Heiko Biskup
  • Johannes Liebl
  • Christine Wünsche
  • Rolf Rascher

Generation and field testing of roughness reference samples for industrial testing of surface roughness levels below 0.5nm Sq

pg. 216-218.

  • (2014)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Thorsten Gerdes
  • K. Kyrgyzbayev
  • A. Rosin
  • A. Saberi
  • A. Füller
  • Rolf Rascher
  • Christine Wünsche

Aims for the development of new optical glass materials

In: 1st European Seminar on Precision Optics Manufacturing

Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach

  • 01.-02.04.2014 (2014)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Zeitschriftenartikel

  • Christian Schopf
  • Rolf Rascher
  • Christine Wünsche

Rauhigkeitsmessungen an großen und schwer zugänglichen Bauteilen

In: MM Industriemagazin-Maschinenmarkt pg. 40-41.

  • (2013)
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
Beitrag in Sammelwerk/Tagungsband

  • Roland Maurer
  • Heiko Biskup
  • Christian J. Trum
  • Rolf Rascher
  • Christine Wünsche

Determination of a suitable parameter field for the active fluid jet polishing process

In: Optifab 2013. null (Proceedings of SPIE)

  • (2013)

DOI: 10.1117/12.2028752

In 2012 a well-known company in the field of high precision optics assigned the University of Applied Sciences Deggendorf to determine a suitable parameter field for the active fluid jet polishing (AFJP) process in order to reach a surface accuracy of at least lambda / 5. The active fluid jet polishing is a relatively new and an affordable sub-aperture polishing process. For a fast and precise identification of the parameter field a considered design of experiment is necessary. The available control variables were the rotational speed of the nozzle, the distance between the test object and the jet, the feed rate, the material of the pin inside the nozzle and the material of the test object itself. In order to reach a significant data density on the one hand and to minimize the number of test runs on the other hand a meander shaped tool path was chosen. At each blank nine paths had been driven whereby at each path another parameter combination was picked. Thus with only one test object nine parameter settings may be evaluated. For the automatized analysis of the tracks a software tool was developed. The software evaluates ten sections which orthogonally intersect the nine tracks on the test-lens. The significant measurement parameters per section are the width and the height of each path as well as the surface roughness within the polished tracks. With the aid of these parameters and further statistical evaluations a suitable parameter field for the goal to find a constant and predictable removal spot was determined. Furthermore up to now over 60 test runs have been successfully finished with nine parameter combinations in each case. As a consequence a test evaluation by hand would be very time-consuming and the software facilitates it dramatically.
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Florian Schneider
  • Markus Schinhärl
  • Christine Wünsche
  • et al.

3D Scale - A system to reduce and compensate the influence of multiple axis errors of rotational axes

In: SPIE Photonics West, Optoelectronic Materials and Devices, SPIE 2013

  • 2013 (2013)
  • Maschinenbau und Mechatronik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
Vortrag

  • M. Willert-Porada
  • Thorsten Gerdes
  • A. Rosin
  • A. Saberi
  • A. Füller
  • Rolf Rascher
  • Christine Wünsche

Flexiplant: schmelzebasierte kontinuierliche Herstellung von low TG-Glas-Preformen (mittels Minimeltertechnologie)

In: 87. Glastechnische Tagung

HVG-DGG: Service und Forschung für die Glasherstellung Bremen

  • 27.-29.05.2013 (2013)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Beitrag in Sammelwerk/Tagungsband

  • Roland Maurer
  • Florian Schneider
  • Christine Wünsche
  • Rolf Rascher

Calculation of the reference surface error by analyzing a multiple set of sub-measurements

  • (2013)

DOI: 10.1117/12.2024003

In the field of precision optics the interferometry is the most applied measurement method to test spherical and flat objects. In principle, a standard interferometer setup is limited to these surface geometries, but interferometric systems may be modified with the aid of CGH’s or the stitching technology. As a consequence aspherical shapes and even freeform optics are measurable up to a certain extent. In an interferometric measurement the measured variable is the optical path difference (OPD) between the reference wave and the test wave. Based on the detected OPD the surface error of the test object is calculated by phase shifting methods for instance. It is evident, that the error from the reference surface affects the determination of the test object surface error. One option to face this problem is the calibration of the system prior to the measurement. For this the determination of the reference surface error may be realized with the aid of a two sphere test or a random ball test e.g. [1]. In the well-known SSI-technology from QED technologies the reference surface error is calculated on the basis of the sub-measurements. Due to the self-calibrating nature of the QED stitching principle [2-4] a calibration of the system prior to the measurement is not necessary. The University of Applied Sciences Deggendorf has implemented a similar algorithm to estimate the reference wave front error, or to be exact the error of the whole optical system, based on a multiple set of sub-measurements. This paper describes the applied algorithm in detail and discusses the results. To verify the implemented tool the results are compared to the outcomes of the QED stitching software. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
  • Maschinenbau und Mechatronik
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Beitrag in Sammelwerk/Tagungsband

  • Florian Schneider
  • Roland Maurer
  • Christine Wünsche
  • R. Stamp
  • G. Smith

Analysis of three different measurement strategies carried out with the TII-3D coordinate measurement system

  • (2013)

DOI: 10.1117/12.2024001

Together with the group of interferometry based systems, coordinate measurement machines are an essential part of the metrology in the modern optical industry. Coordinate measurement machines commonly consist of a multi axes framework. They are designed to operate in a defined three dimensional work zone, where every possible point can be reached by the measurement tool tip. This basic design principle leads to some interdependent challenges. A detailed measurement result needs a large amount of measurement points to detect even minor irregularities and short-wave errors. However, a rising of the amount of measurement points increases the corresponding measurement time analogous. On the other hand, the extended operation time increases the access of undesired thermal and dynamic influences, which cause multiple errors to the measurement result. Furthermore, modern production processes need rapid metrology systems to aid the machining time. This paper discusses results obtained by operating with three different measurements in order to find an agreement between speed and certainty of the coordinate measurement machine. The topographic coordinate measurement system TII- 3D had been re-developed at the University of Applied Sciences Deggendorf in the laboratory of optical Engineering and it is equipped with three different measurement strategies. The first mode, the Track-Mode operates in concentric circles on top of the surface of the object to be measured. The Spiral-Mode measures along a dynamic moveable spiral line and the Section-Mode produces multiple cross-sections. © (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
  • Maschinenbau und Mechatronik
Vortrag

  • S. Draxinger
  • Christine Wünsche
  • Rolf Rascher

Subaperture-polishing with variable spots

In: Renewable Energy and the Environment, Freeform Optics (Freeform)

The Optical Society of America (OSA) Tucson, AZ, USA

  • 03.-06.11.2013 (2013)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Heiko Biskup
  • Rolf Rascher
  • Christine Wünsche

Laserdiffraktometrie - Korngrößenverteilung in Poliermitteln . Posterbeitrag

In: 5. Optikseminar

Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach

  • 30.07.2012 (2012)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Paul Schötz
  • Johannes Liebl
  • Rolf Rascher
  • Christine Wünsche
  • Engelbert Hofbauer
  • Karlheinz Penzkofer

Metrology at Technologie Campus Teisnach

In: 8th Workshop Asphere Metrology

Physikalisch-Technische Bundesanstalt (PTB)/Kompetenzzentrum Ultrapräzise Oberflächenbearbeitung e.V. Braunschweig

  • 12.-13.11.2012 (2012)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Heiko Biskup
  • Rolf Rascher
  • Christine Wünsche

Poliermittelerprobung II

In: Spectaris - 6. Treffen des Industriekonsortiums Seltene Erden

Mainz

  • 23.02.2012 (2012)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Christian Schopf
  • Christine Wünsche

Projekt DuV . Posterpräsentation

In: Internes Optikseminar der Forschungsgruppe Optik

Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach

  • 2012 (2012)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Heiko Biskup
  • Rolf Rascher
  • Christine Wünsche

Laserdiffraktometrie zur Charakterisierung von Korngrößen und deren Verteilung in Poliermitteln

In: 5. Optikseminar

Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach

  • 30.07.2012 (2012)
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
Vortrag

  • Christian Schopf
  • Christine Wünsche

Projekt 3P-Fertig . Posterpräsentation

In: Internes Optikseminar der Forschungsgruppe Optik

Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach

  • 2012 (2012)
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik
Vortrag

  • Christian Schopf
  • Christine Wünsche

Herstellung von Präszisionsoptiken mit Formabweichung kleiner L/50

In: 1. Wetzlarer Herbsttagung "Moderne Optikfertigung"

Wetzlar

  • 27.09.2011 (2011)
  • TC Teisnach Optik
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
Vortrag

  • Heiko Biskup
  • Rolf Rascher
  • Christine Wünsche

Poliermittelerprobung I

In: Spectaris - 4. Treffen des Industriekonsortiums Seltene Erden

Technische Hochschule Deggendorf/Technologie Campus Teisnach Teisnach

  • 13.07.2011 (2011)
  • Angewandte Naturwissenschaften und Wirtschaftsingenieurwesen
  • TC Teisnach Optik