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Prof. Dr. Simon Zabler

  • Head of research at TC Plattling
  • Teaching
  • Head of Fraunhofer Application Center CT for Measurement Technology CTMT


ITC2 B0.14


consulting time

Tuesday 11:30-13:00 and with appointment




TC Plattling, C010, L009

core competencies

Computed Tomography, Imaging, Image-and Signal-Processing, Physics, Materials

Forschungs- und Lehrgebiete

Computed Tomography, Robotics, Measurement Science, Mathematics


since 2021 Professor for Imaging Methods centered around Computed Tomography TH Deggendorf 2018–2021 Deputy head of the Magnetic Resonance- and X-ray department MRB, Fraunhofer IIS 2011–2018 Habilitation, Chair of X-ray Microscopy LRM, Julius-Maximilians-University Würzburg 2015–2018 Head of Fraunhofer project group NanoCT Systems NCTS, Fraunhofer IIS, Würzburg 2011–2015 Head of research and education, Chair of X-ray Microscopy LRM, University Würzburg 2009–2011 Assistant Professor at the department of Materials Engineering, TU Berlin 2008–2009 Postdoc, Max-Planck Institute of Colloids and Interfaces (biomaterials), Potsdam 2004–2007 Doctorate, Technical University (TU) Berlin, Doctor of natural sciences 2003–2004 European sales engineer for Laser Measurement Systems, Polytec GmbH, Waldbronn 2001–2002 Diplôme d’Etudes Approfondies (first doctorate), Physique des Matériaux, Université Grenoble 2000–2002 Diplôme d’Ingénieur /Master, École Nationale Supérieure de Physique de Grenoble (ENSPG) 1997–2003 Diploma in Physics, University Karlsruhe (TH)